Handbook of Microscopy for Nanotechnology~tqw~ darksiderg

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  Handbook of Microscopy for Nanotechnology~tqw~ darksiderg
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  *******************************************************************************<br /> Handbook of Microscopy for Nanotechnology<br /> *******************************************************************************<br /> <br /> -------------------------------------------------------------------------------<br /> General Information<br /> -------------------------------------------------------------------------------<br /> Type.................: Ebook<br /> Part Size............: 18,518,871 bytes<br /> <br /> <br /> <br /> <br /> -------------------------------------------------------------------------------<br /> Post Information<br /> -------------------------------------------------------------------------------<br /> Posted by............: ~tqw~<br /> <br /> -------------------------------------------------------------------------------<br /> Release Notes<br /> -------------------------------------------------------------------------------<br /> Nanostructured materials take on an enormously rich variety of properties and <br /> promise exciting new advances in micromechanical, electronic, and magnetic <br /> devices as well as in molecular fabrications. The <br /> structure-composition-processing-property relationships for these sub 100 <br /> nm-sized materials can only be understood by employing an array of modern <br /> microscopy and microanalysis tools. This complete reference provides a thorough <br /> treatment of these techniques and their applications in this fast-growing field.<br /> <br /> Table Of Contents<br /> <br /> Preface xv<br /> List of Contributors xvii<br /> Part I. OPTICAL MICROSCOPY, SCANNING PROBE MICROSCOPY, ION MICROSCOPY, AND <br /> NANOFABRICATION 1<br /> 1. Confocal Scanning Optical Microscopy and Nanotechnology 3<br /> 2. Scanning Near Field Optical Microscopy in Nanosciences 25<br /> 3. Scanning Tunneling Microscopy 55<br /> 4. Visualization of Nanostructures with Atomic Force Microscopy 113<br /> 5. Scanning Probe Microscopy for Nanoscale Manipulation and Patterning 157<br /> 6. Scanning Thermal and Thermoelectric Microscopy 183<br /> 7. Imaging Secondary Ion Mass Spectrometry 207<br /> 8. Atom Probe Tomography 227<br /> 9. Focused Ion Beam Systems&mdash;A Multifunctional Tool for Nanotechnology 247<br /> 10. Electron Beam Lithography 287<br /> Part II. ELECTRON MICROSCOPY 323<br /> 11. High Resolution Scanning Electron Microscopy 325<br /> 12. High-Spatial Resolution Quantitative Electron Beam Microanalysis for <br /> Nanoscale Materials 361<br /> 13. Characterization of Nano-Crystalline Materials using Electron Backscatter<br /> Diffraction in the Scanning Electron Microscope 401<br /> 14. High-Resolution Transmission Electron Microscopy 427<br /> 15. Scanning Transmission Electron Microscopy 455<br /> 16. In-Situ Electron Microscopy for Nanomeasurements 493<br /> 17. Environmental Transmission Electron Microscopy in Nanotechnology 531<br /> 18. Electron Nanocrystallography 567<br /> 19. Tomography using Transmission Electron Microscope 601<br /> 20. Off-Axis Electron Holography 629<br /> 21. Sub-nm Spatially Resolved EELS (Electron Energy-Loss Spectroscopy):<br /> Methods, Theory and Applications 653<br /> 22. Imaging Magnetic Structures using Transmission Electron Microscopy Methods <br /> 683<br /> Index 717<br /> <br /> Product Details<br /> <br /> * ISBN: 1402080034<br /> * ISBN-13: 9781402080036<br /> * Format: Hardcover, 731pp<br /> * Publisher: Springer-Verlag New York, LLC<br /> * Pub. Date: March 2005<br /> <br /> -------------------------------------------------------------------------------<br /> Install Notes<br /> -------------------------------------------------------------------------------<br /> Adobe Acrobat Reader<br /> <br /> <br />
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